Scope & Topics

Continuing technological improvements are opening new areas of application in micro- and nano-electronics and photonics. Micro- and nano-sensor systems include on the same die or in the same packaging also the post-processing electronics for a wide range of applications. Many systems are accommodated in remote or noisy locations, e.g. industrial process control, automotive systems, space aircrafts, as well as in biomedical, particle physics and electrochemical systems. The environmental conditions may be very harsh reducing the overall lifetime due to fast ageing, thus determining the performance degradation. Post-processing may also degrade the performance of the sensor system.
Although significant advances have been reported over the last two decades, many problems are still unsolved. Modeling, design procedures and fabrication techniques are open for research, while industrial interest is aiming to satisfying technological, costing and manufacturing requirements.
The aim of the workshop is to provide a forum for discussing and experience exchange among experts actively involved in research, development and evaluation of new concepts, theoretical methods and experimental characterization well as in testing techniques concerning micro- and nano-sensor systems.

Papers are solicited in the following and related topics:

  • New materials and new technologies for sensors
  • Sensor modeling and design techniques
  • Sensors for space, biomedical, automotive, high-energy particle physics, environmental and other applications
  • Optoelectronic and photonic sensors
  • MEMS and MOEMS-based sensors
  • Post-processing electronics and optical and electronic interfaces
  • Noise reduction techniques in sensors
  • Sensor testing procedures

The IWASI Program Committee invites authors to submit papers in the above areas. The accepted submissions will be included in the workshop proceedings.
A selection of papers will be invited to be re-submitted for a special issue of the Microelectronics Journal published by Elsevier.